Mekitec Secures Patent in the US for X-Ray Image Analysis with AI
Mekitec, a leading provider of food quality control systems, is proud to announce the granting of a new patent for its food product monitoring solution that integrates X-ray imaging with advanced machine learning techniques. This patented technology represents an advancement in the detection of foreign objects and quality defects in food products, enhancing safety and efficiency in the food production industry.
The patented solution leverages a dual-analysis approach to inspect food products on production lines. By combining traditional X-ray image analysis with sophisticated pattern recognition powered by artificial intelligence (AI), Mekitec’s technology substantially improves the accuracy of detecting contaminants and anomalies that were previously challenging to identify with conventional methods.
Advancing Food Industry with Smarter Inspection Solutions
This dual-analysis approach integrates texture and pattern recognition, enabling the detection of a wider range of contaminants, including smaller and overlapping objects that traditional methods often miss. Moreover, the integration of AI allows the system to learn from production-specific data, delivering customized inspections tailored to various food products and potential contaminants.
“We are thrilled to receive this patent, which underscores our commitment to advancing food safety through technological innovation,” said Max Uusitalo, CEO of Mekitec. “Our new solution not only enhances the detection capabilities of X-ray inspection systems but also aligns with the industry’s move towards smarter, more reliable quality control methods.”
Mekitec’s patented technology directly addresses key limitations of existing X-ray inspection systems, such as difficulties in detecting objects with similar densities or those overlapping within a product. These advancements are especially beneficial for complex food items and challenging packaging scenarios where precision is critical. By providing more reliable detection of foreign objects and quality defects, the technology enhances food safety and reduces the risk of unsafe products reaching consumers. This patent marks a significant step forward in supporting the food industry’s move toward smarter, more adaptable quality control solutions.
About Mekitec
Founded in Finland, Mekitec specializes in developing and manufacturing high-performance X-ray inspection systems for the global food industry. With a focus on delivering cutting-edge technology and exceptional customer service, Mekitec aims to ensure that high-quality food is available for everyone. The company’s solutions are designed to meet the stringent safety standards of food manufacturers while offering cost-effective and user-friendly operations.
MEDIA CONTACT
Ms. Heli Mehtälä
Director, Marketing & Portfolio
heli.mehtala[at]mekitec.com